As technology scales, negative bias temperature instability (NBTI) becomes one of the\nprimary failure mechanisms for Very Large Scale Integration (VLSI) circuits. Meanwhile, the leakage\npower increases dramatically as the supply/threshold voltage continues to scale down. These two\nissues pose severe reliability problems for complementary metal oxide semiconductor (CMOS)\ndevices. Because both the NBTI and leakage are dependent on the input vector of the circuit, we\npresent an input vector control (IVC) method based on a linear programming algorithm, which\ncan co-optimize circuit aging and power dissipation simultaneously. In addition, our proposed\nIVC method is combined with the supply voltage assignment technique to further reduce delay\ndegradation and leakage power. Experimental results on various circuits show the effectiveness of\nthe proposed combination method.
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